Structural Studies of Vanadium Soaps in Solid State By X-Ray Diffraction Analysis

Characterization of some commercial soaps by X-ray diffraction.

Surface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis

An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...

Structural Analysis of Pan Fiber by X-ray Diffraction

Polyacrylonitryle (PAN) fibers are used on a large scale in textile industry but, some sorts of PAN fibers are valuable precursors for specific carbon fiber (CF) due to their best fitness to the purpose e.g. for high strength CF or for active CF. The application of PAN as precursors of CF is based on its specific structure and texture. Thus, the properties of PAN base CF strongly depend on PAN ...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...